System UHV I: PEEM/ LEEM Microscopes (Photoemission Electron Microscope/ Low Energy Electron Microscope) from Elmitec
Microscope PEEM Mikroskop SPE-PEEM is a spectroscopic photoemission electron microscope working at UHV conditions. The microscope is equipped in energy analyzer. Currently it is installed at the Polish National Synchrotron SOLARIS.
Microscope LEEM Mikroskop LEEM (Low Energy Electron Microscope) is a microscope working with low energy electrons at UHV conditions. The microscope is equipped with an energy analyzer and aberration corrector. The microscope can work in the photoemission mode with a Hg lamp (PEEM).
Microscopes are dedicated for the imaging of surface nanostructures, in mesoscale, in real time and in a wide range of temperatures (-180 ÷ 1200°C). Ex situ and in situ prepared samples can be measured in microscopes.
Preparation chambers of microscopes are equipped with:

  • molecular beam epitaxy (MBE) system
  • Auger’ electron spectroscope (AES)
  • low energy electron diffractometer (LEED)
  • residual gas analyzer (RGA)
  • ion gun
  • gas dosing system

System UHV II: STM The Ultra high vacuum (UHV) system for investigations of epitaxial layers on single-crystalline substrates.It is equipped with:

  • Molecular Beam Epitaxy (MBE)
  • Auger Electron Spectroscopy (AES)
  • Low Energy Electron Diffraction (LEED)
  • Scanning tunneling Microscopy (STM)
  • Conversion Electron Mössbauer Spectroscopy (CEMS)
  • Ion bombardment and etching
  • Cooling/heatin g samples in the temperature range 100 -2000 K
  • Residual gas analyzer (RGA)
  • Gas dosing system
  • Base pressure < 1*10-10 mbar

System UHV III:System wielokomorowy The Ultra high vacuum (UHV) system for investigations of solid state surfaces (bulk and powdered).
It is equipped with:

  • Molecular Beam Epitaxy (MBE)
  • X-ray Photoelectron Spectroscopy (XPS)
  • Scanning Probe Microscope (SPM:STM/AFM/MFM)
  • Low Energy Electron Diffraction (LEED/AES)
  • Temperature Programmed Desorption (TPD);
  • (RGA SRS 200)
  • Sample cooling/heating (100 K – 2000 K)
  • Ion bombardment and etching
  • Residual gas analyzer (RGA)
  • Gas dosing system
  • High-pressure catalytic reactor
  • Base pressure < 1*10-10 mbar

System IV: Mössbauer spectrometer for measurement in transmission and scattering geometry.

Mössbauer spectroscopy enables the study of local chemical, structural and magnetic properties of solid phase materials. The laboratory has 57Co sources that allow measurements of samples containing iron. The Mössbauer active isotope is 57Fe, whose natural abundance is 2%. Therefore, the limit of the iron concentration when measurements are easy to accomplish is about 3% at., while for samples enriched in the 57Fe isotope this limit is lowered to a fractions of percent (unfortunately, the 57Fe isotope is not cheap).
Measurements are feasible in transmission and scattering geometry.
For transmission measurements, the sample must be a thin foil or pellet with an area of the order of cm2 and a surface density of Fe of 1 - 10 mg/cm2. Measurements can be made in the range of 80 K to room temperature. Thanks to the cryostat, liquid samples can be measured after freezing. In this option, special containers holding approximately 1 cm3 of liquid are used to measure organic liquids with low iron concentration.
In the scattering geometry, the conversion electrons are detected. Samples (in principle of any shape, but in a solid form) are mounted in a flow detector in which the working gas is a He-10% CH4 mixture. Measurements can be made at reduced temperature (to about 150 K) and in a small magnetic field, which allows the characterization of superparamagnetic properties of nanoparticles.