Scanning Electron Microscope Laboratory
Our activities focus on an advance studies of a very broad spectrum of samples with the use of the scanning electron microscope JEOL JSM-7500F equipped with the X-ray energy dispersive (EDS) system — INCA PentaFetx3. During the analysis a focused electron beam scans the sample and as a result the images carrying the information about the samples’ morphology and composition are delivered. The configuration of our microscope enables the thorough examinations of provided specimen and allows the observations of fine nonostructures of a few nanometers in size. Moreover, the presence of the TED detector extends the imaging capabilities of our instrument and provide the unique and valuable information that only transmitted electrons could deliver.
We cooperate with both the scientific and academic community as well as the industrial partners in Poland and abroad.